Coming soon
Publications
Can a Programmable Phase Plate Serve as an Aberration Corrector in the Transmission Electron Microscope (TEM)?
Francisco Vega Ibáñez, Armand Béché, Jo Verbeeck
2022, arXiv:2205.07697
Demonstration of a 2×2 programmable phase plate for electrons
Jo Verbeeck, Armand Béché , Knut Müller-Caspary, Giulio Guzzinati, Minh Anh Luong, Martien Den Hertog
2018, Ultramicroscopy, 190, 58-65
Prospects for versatile phase manipulation in the TEM: beyond aberration correction
Giulio Guzzinati, Lura Clark, Armand Béché, Roeland Juchtmans, Ruben Van Boxem, Michael Mazilu, Jo Verbeeck.
2015, Ultramicroscopy, 151, 85-93
Patents pending
The electron phase plate product is manufactured and sold under licenses from the University of Antwerp (patents “Spatial phase manipulation of charged particle beam” EP3698394, US11062872, JP7104437, CN111213220)
